DETERMINATION OF THE ONSET OF CRYSTALLIZATION OF AMORPHOUS MATERIALS USING DIFFERENT METHODS

Authors
HOFSTETTER W SASSIK H GROSSINGER R TRAUSMUTH R VERTESY G KISS LF
Citation
W. Hofstetter et al., DETERMINATION OF THE ONSET OF CRYSTALLIZATION OF AMORPHOUS MATERIALS USING DIFFERENT METHODS, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 226, 1997, pp. 213-217
Citations number
5
Categorie Soggetti
Material Science
Journal title
Materials science & engineering. A, Structural materials: properties, microstructure and processing → ACNP
ISSN journal
09215093
Volume
226
Year of publication
1997
Pages
213 - 217
Database
ISI
SICI code
0921-5093(1997)226:<213:DOTOOC>2.0.ZU;2-I
Abstract
On as-cast ribbons of the system FexCo85-xB15 (x = 85, 73, 64, 55, 42. 5, 21, 8) and also Co80B20, electrical resistivity and a.c.-susceptibi lity measurements between room temperature and the crystallization tem perature were performed in order to study the crystallization behaviou r. These data were compared with differential scanning calorimetry (DS C) results. Generally, a two-step crystallization process was observed . The critical temperatures as determined from rho(T) and chi(T) measu rements lie below that obtained from DSC data. The activation energies determined from Kissinger plots using data from the different methods agree within the experimental errors. (C) 1997 Elsevier Science S.A.