Plasma diagnostics in industry

Citation
Mb. Hopkins et Jf. Lawler, Plasma diagnostics in industry, PLASMA PHYS, 42, 2000, pp. B189-B197
Citations number
8
Categorie Soggetti
Physics
Journal title
PLASMA PHYSICS AND CONTROLLED FUSION
ISSN journal
07413335 → ACNP
Volume
42
Year of publication
2000
Supplement
12B
Pages
B189 - B197
Database
ISI
SICI code
0741-3335(200012)42:<B189:PDII>2.0.ZU;2-5
Abstract
Plasma processing forms an invaluable part of semiconductor device manufact uring. For the most part, commercial tools have relied on an empirical proc ess for their evolution and relied exclusively on plasma characterization o nly at the development stage. As this industry advances there is the need t o provide non-invasive plasma characterization and diagnostics on the proce ssing equipment, in order to provide more control over the plasma propertie s. We outline some of the typical configurations used in the industry and d escribe two of the measurement techniques we have developed for the charact erization of these industrial plasma sources.