Millimeter-wave reflectometry for electron density profile and fluctuationmeasurements on NSTX

Citation
S. Kubota et al., Millimeter-wave reflectometry for electron density profile and fluctuationmeasurements on NSTX, REV SCI INS, 72(1), 2001, pp. 348-351
Citations number
16
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
72
Issue
1
Year of publication
2001
Part
2
Pages
348 - 351
Database
ISI
SICI code
0034-6748(200101)72:1<348:MRFEDP>2.0.ZU;2-Z
Abstract
A millimeter-wave reflectometry system for electron density profile and flu ctuation measurements is being developed and installed on the National Sphe rical Torus Experiment. The initial frequency coverage will be in the bands 12-18, 20-32, and 33-50 GHz, provided by frequency-tunable solid-state sou rces. These frequencies correspond to O-mode cutoff densities ranging from 1.8 x 10(12) to 3.1 x 10(13) cm(-3), which will span both the plasma core ( rho = r/a < 0.8) and edge (rho >0.8) regions. Operated as a broadband swept -frequency (frequency-modulated continuous-wave) reflectometer, the diagnos tic is expected to provide routine (shot-to-shot) time- (less than or equal to 50 mus) and spatially resolved (similar to1 cm) density profiles. The p revious hardware can be easily reconfigured as a fixed-frequency reflectome ter for density fluctuation measurements. The combination of measurements w ould be valuable for studying phenomena such as possible L- to H-mode trans itions and edge-localized modes. (C) 2001 American Institute of Physics.