Point-projection x-ray radiography using an X pinch as the radiation source

Citation
Ta. Shelkovenko et al., Point-projection x-ray radiography using an X pinch as the radiation source, REV SCI INS, 72(1), 2001, pp. 667-670
Citations number
10
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
72
Issue
1
Year of publication
2001
Part
2
Pages
667 - 670
Database
ISI
SICI code
0034-6748(200101)72:1<667:PXRUAX>2.0.ZU;2-#
Abstract
Using an X pinch as a source of radiation for point-projection radiography, it is possible to project a high-resolution (1-10 mum) shadow image of den se plasma or test objects onto x-ray-sensitive film. The emission character istics of X pinches composed of a wide variety of materials have been studi ed using several diagnostics. The pulse duration and shape of the x-ray bur sts were measured in the 1.5-6 keV band using fast diamond PCDs and an x-ra y streak camera with sweep speeds as fast as 10 ns for the full sweep (3.5 cm). To investigate the line and continuum radiation emitted by the X pinch es, a convex spectrograph using a mica or KAP crystal, and a spectrograph b ased on a spherically bent mica crystal were used. Summarizing the data, in cluding radiography results, wires known to have slower expansion rates and high boiling temperatures (NiCr, Ti, Nb, Mo, Pd, Ta, W, and Pt) appeared t o yield the smallest x-ray source sizes, i.e., gave the best spatial resolu tion in radiographs and provided subnanosecond time resolution. All of thes e materials yield intense continuum radiation with energy up to 6 keV, and the highest resolution images are achieved using only the continuum radiati on from the X pinch. (C) 2001 American Institute of Physics.