10 and 5 mu m pinhole-assisted point-projection backlit imaging for the National Ignition Facility

Citation
Ab. Bullock et al., 10 and 5 mu m pinhole-assisted point-projection backlit imaging for the National Ignition Facility, REV SCI INS, 72(1), 2001, pp. 690-693
Citations number
8
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
72
Issue
1
Year of publication
2001
Part
2
Pages
690 - 693
Database
ISI
SICI code
0034-6748(200101)72:1<690:1A5MMP>2.0.ZU;2-0
Abstract
In pinhole-assisted point-projection backlighting, pinholes are placed a sm all distance (of order 1 mm) away from the backlighter source to produce im ages with large field of view. Pinholes placed close to high-power backligh ter sources can vaporize and, if sufficiently small, close due to x-ray dri ven ablation, thereby potentially limiting the usefulness of this method. A study of streaked one-dimensional backlit imaging of 25 mum W wires using the OMEGA laser at the University of Rochester is presented. The pinhole cl osure time scale for 10 mum pinholes placed 0.45 and 1 mm distant from a 0. 6 TW Ti backlighter is 1.3 and 2.2 ns, respectively. Similar time scales fo r 5 mum pinholes is also presented. Successful wire imaging prior to pinhol e closure is clearly demonstrated. (C) 2001 American Institute of Physics.