Low-cost, robust, filtered spectrometer for absolute intensity measurements in the soft x-ray region

Citation
Ne. Lanier et al., Low-cost, robust, filtered spectrometer for absolute intensity measurements in the soft x-ray region, REV SCI INS, 72(1), 2001, pp. 1188-1191
Citations number
11
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
72
Issue
1
Year of publication
2001
Part
2
Pages
1188 - 1191
Database
ISI
SICI code
0034-6748(200101)72:1<1188:LRFSFA>2.0.ZU;2-M
Abstract
We have developed a low-cost, robust, multifoil-filtered spectrometer to pr ovide absolute measurements of low-Z impurity concentrations in the Madison Symmetric Torus reversed-field pinch. The spectrometer utilizes an array o f six thin-film coated soft x-ray diodes. Each multilayered coating is spec ifically tailored to isolate the K-shell emission lines of H- and He-like o xygen, carbon, and aluminum. With calibrations obtained via a synchrotron s ource, absolute measurements of photon flux have been made. We address the technical aspects of this diagnostic and present impurity data from both st andard and high-confinement plasma discharges. (C) 2001 American Institute of Physics.