Bismuth-based layered and perovskite tantalates, titanates and niobates hav
e received special attention as ferroelectric and dielectric materials. Sr1
-xBaxBi2Ta2O9 (x = 0.0, 0.2, 0.5, 0.7, and 1) were synthesized using a chem
ical solution route. As revealed by X-ray diffraction studies, they make a
complete solid solution for all values of x. Thin films were deposited by s
pin coating. Stoichiometric thin films were achieved on quartz and stainles
s steel substrates at a process temperature below 700 degreesC. Films were
also characterized by Raman and impedance spectroscopy. The ferroelectric m
emory has been measured with Pr = 27 mum/cm(2) on the Sr0.3Ba0.7Bi2Ta2O9 fi
lm deposited on a stainless steel substrate and annealed at 650 degreesC. (
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