ATOMIC-FORCE MICROSCOPY STUDIES OF 2-DIMENSIONAL EPITAXIAL-GROWTH OF BI2SR2-XLAXCU6-FILMS(DELTA THIN)

Authors
ZHANG YZ YANG HT LI L YANG DG TAO HJ ZHAO BR ZHAO ZX
Citation
Yz. Zhang et al., ATOMIC-FORCE MICROSCOPY STUDIES OF 2-DIMENSIONAL EPITAXIAL-GROWTH OF BI2SR2-XLAXCU6-FILMS(DELTA THIN), Journal of materials science letters, 16(13), 1997, pp. 1095-1098
Citations number
17
Categorie Soggetti
Material Science
Journal title
Journal of materials science letters → ACNP
ISSN journal
02618028
Volume
16
Issue
13
Year of publication
1997
Pages
1095 - 1098
Database
ISI
SICI code
0261-8028(1997)16:13<1095:AMSO2E>2.0.ZU;2-B