XPS and TPR examinations of gamma-alumina-supported Pd-Cu catalysts

Citation
J. Batista et al., XPS and TPR examinations of gamma-alumina-supported Pd-Cu catalysts, APP CATAL A, 206(1), 2001, pp. 113-124
Citations number
37
Categorie Soggetti
Physical Chemistry/Chemical Physics","Chemical Engineering
Journal title
APPLIED CATALYSIS A-GENERAL
ISSN journal
0926860X → ACNP
Volume
206
Issue
1
Year of publication
2001
Pages
113 - 124
Database
ISI
SICI code
0926-860X(20010115)206:1<113:XATEOG>2.0.ZU;2-G
Abstract
Alumina-supported palladium-copper catalysts, which promote liquid-phase ni trate reduction, have been prepared according to different impregnation seq uences of gamma -Al2O3 support and characterized by X-ray photoelectron spe ctroscopy (XPS), X-ray induced Auger electron spectroscopy (XAES) and tempe rature-programmed reduction (TPR). Analysis of Pd XPS/XAES spectra reveals that palladium is present on the gamma -alumina support in the metallic for m. Copper is reduced at lower temperatures in the presence of palladium par ticles compared to the CuO/gamma -Al2O3 sample. Due to the low copper conte nt in catalysts (sigma (Cu)approximate to 10(14) atoms cm(-2)), the XPS/XEA S spectral features of reduced copper species are quite different from thos e of bulk copper. As shown by TPR and XPS/XAES data, formation of highly di spersed Pd-Cu bimetallic clusters is suggested. It was discovered by means of TPR analysis that the catalyst preparation in which the gamma -alumina s upport is impregnated first by copper salt, results in higher formation of the Pd-Cu alloy. (C) 2001 Elsevier Science B.V. All rights reserved.