S. Schedin et al., Highly sensitive pulsed digital holography for built-in defect analysis with a laser excitation, APPL OPTICS, 40(1), 2001, pp. 100-103
A highly sensitive method is presented for noninvasive defect analysis on t
hin structures with a Q-switched double-pulsed ruby laser with frequency do
ubling (347 nn). In our research we feature an all-optical arrangement, whe
re a focused laser pulse derived from the same ruby laser (694 nm) acts as
a built-in synchronous excitation source for digital holographic interferom
etry. The recordings are made with a CCD camera for capturing two holograms
(two states of the specimen) corresponding to the two UV laser pulses with
a short time separation (10-50 mus). Subtraction of the phase distribution
in two digital holograms gives a fringe phase map that shows the change in
deformation of the specimen between the recordings. The advantage of the p
roposed method is two fold. First, the use of a shorter wavelength results
in a higher sensitivity. Second, owing to the induced synchronous built-in
optical excitation, the specimen is not subjected to any external physical
excitation devices. Experimental results are presented on identification an
d evaluation of defects in thin metal sheets. America OCIS codes: 090.2880,
140.3540, 120.4630.