Highly sensitive pulsed digital holography for built-in defect analysis with a laser excitation

Citation
S. Schedin et al., Highly sensitive pulsed digital holography for built-in defect analysis with a laser excitation, APPL OPTICS, 40(1), 2001, pp. 100-103
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
40
Issue
1
Year of publication
2001
Pages
100 - 103
Database
ISI
SICI code
0003-6935(20010101)40:1<100:HSPDHF>2.0.ZU;2-M
Abstract
A highly sensitive method is presented for noninvasive defect analysis on t hin structures with a Q-switched double-pulsed ruby laser with frequency do ubling (347 nn). In our research we feature an all-optical arrangement, whe re a focused laser pulse derived from the same ruby laser (694 nm) acts as a built-in synchronous excitation source for digital holographic interferom etry. The recordings are made with a CCD camera for capturing two holograms (two states of the specimen) corresponding to the two UV laser pulses with a short time separation (10-50 mus). Subtraction of the phase distribution in two digital holograms gives a fringe phase map that shows the change in deformation of the specimen between the recordings. The advantage of the p roposed method is two fold. First, the use of a shorter wavelength results in a higher sensitivity. Second, owing to the induced synchronous built-in optical excitation, the specimen is not subjected to any external physical excitation devices. Experimental results are presented on identification an d evaluation of defects in thin metal sheets. America OCIS codes: 090.2880, 140.3540, 120.4630.