Sr-ferrite thin films grown on sapphire by pulsed laser deposition

High-quality epitaxial strontium-hexaferrite (SrFe12O19) thin films were gr own by pulsed laser deposition (PLD) on c-cut sapphire using KrF* excimer l aser at a fluency of 2 J/cm(2) and substrate temperature of 800 degreesC in 100 mTorr oxygen environment. The X-ray diffraction (XRD) and morphology a nalyzes showed films with excellent crystalline structure and Aat surface. The thickness was found to influence considerably the surface morphology an d magnetic properties of the as-deposited films. The highest orientation an d the best morphology with smooth surface and fine grain structure was obta ined for the him having a thickness of 750 nm. The highest coercive force o f 1453 Oe was measured for this film in perpendicular to the plane directio n. (C) 2000 Elsevier Science B.V. All rights reserved.