In order to create crystal structures by depositing consecutive atomic or u
nit-cell layers of different materials, a layer-by-layer growth mode is a p
rerequisite: nucleation of each next layer may only occur after the previou
s layer is completed. We introduced a growth method based on a periodic seq
uence: very fast deposition of the amount of material needed to complete on
e monolayer followed by an interval in which no deposition takes place and
the film can reorganize. This makes it possible to grow in a layer-by-layer
fashion in a growth regime (temperature, pressure) when otherwise island f
ormation would dominate the growth. Here, we present imposed layer-by-layer
growth of homo-epitaxial SrTiO3 as monitored by high-pressure reflection h
igh-energy electron diffraction (RHEED) and atomic force microscopy (AFM).
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