Lead magnesium niobate (PMN) thin films were prepared by pulsed laser depos
ition technique on different substrates. Because of the fit of the unit cel
l structure and lattice constant with PMN. lead titanium zirconate (PZT) te
mplate layers have been deposited on top of the bottom electrodes, while an
other set of samples has been prepared by directly depositing PMN on metall
ized substrates. The use of PZT layer favored the obtaining of an oriented
crystalline PMN film with a minor pyrochlore content at relatively low temp
erature (500 degreesC). The room temperature small-signal dielectric consta
nt of the films has been measured on structures with 1 mm x 1 mm evaporated
Au top electrodes, by using an impedance analyzer. The obtained values of
the dielectric constant have been found to be much smaller than that of bul
k PMN due to the presence of a very thin transition layer with low dielectr
ic constant at the electrode/film interface, which highly decreases the eff
ective dielectric constant of the samples. The measurement of the piezoelec
tric properties evidenced the rather surprising presence of a relatively st
rong piezoelectric effect in PMN films in the absence of a bias electric fi
eld. (C) 2000 Elsevier Science B.V. All rights reserved.