The thermoelectric power and d.c. conductivity of co-evaporated Mn/SiO
x films, 100 nm thick, containing 20 to 100 at% Mn have been measured
over the temperature ranges 275 to 580 K and 110 and 575 K, respective
ly. Three conduction regions have been identified: p-type, via non-pol
aronic holes and small polarons; intrinsic and metallic. The d.c. cond
uctivity arises from a combination of non-activated and activated proc
esses.