CONDUCTION MECHANISMS IN COEVAPORATED MIXED MN SIOX THIN-FILMS/

Authors
ZAIDI SZA BEYNON J STEELE CB
Citation
Sza. Zaidi et al., CONDUCTION MECHANISMS IN COEVAPORATED MIXED MN SIOX THIN-FILMS/, Journal of Materials Science, 32(13), 1997, pp. 3349-3353
Citations number
18
Categorie Soggetti
Material Science
Journal title
Journal of Materials Science → ACNP
ISSN journal
00222461
Volume
32
Issue
13
Year of publication
1997
Pages
3349 - 3353
Database
ISI
SICI code
0022-2461(1997)32:13<3349:CMICMM>2.0.ZU;2-R
Abstract
The thermoelectric power and d.c. conductivity of co-evaporated Mn/SiO x films, 100 nm thick, containing 20 to 100 at% Mn have been measured over the temperature ranges 275 to 580 K and 110 and 575 K, respective ly. Three conduction regions have been identified: p-type, via non-pol aronic holes and small polarons; intrinsic and metallic. The d.c. cond uctivity arises from a combination of non-activated and activated proc esses.