Hydrostatic-pressure-induced degradation of MBE CdTe/CdMgTe heterostructures grown on GaAs substrate

Modulation doped CdTe/Cd1-xMgxTe heterostructures grown on GaAs substrates were studied by means of magnetotransport measurements performed under hydr ostatic pressure, as well as X-ray diffraction and cross-sectional transmis sion electron microscopy completed before and after pressure experiments. W e have shown that hydrostatic pressure leads to the creation of dislocation s in the CdTe/Cd1-xMgxTe structure in the vicinity of the interface between the II-VI structure and the substrate. The dislocation-enhanced internal s tress leads to internal microfractures, resulting in a permanent damage of the heterostructure.