Measurement of a depth profile in a random medium using coherent backscattering of light

Authors
Okamura, Y Yamamoto, S
Citation
Y. Okamura et S. Yamamoto, Measurement of a depth profile in a random medium using coherent backscattering of light, IEICE TR EL, E83C(12), 2000, pp. 1809-1813
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEICE TRANSACTIONS ON ELECTRONICS
ISSN journal
09168524 → ACNP
Volume
E83C
Issue
12
Year of publication
2000
Pages
1809 - 1813
Database
ISI
SICI code
0916-8524(200012)E83C:12<1809:MOADPI>2.0.ZU;2-J
Abstract
An averaged intensity peak profile of light scattered from a random medium depends on a thickness of a sample as well as parameters such as a volume f raction and a size of particles composing the medium. We used this dependen ce to measure a depth profile varied in the random medium. We demonstrated the possible simultaneous measurement of a transport mean free path and a d epth of an aqueous suspension of titanium particles.