FVTD simulation for random rough dielectric surface scattering at low grazing angle

Citation
Ky. Yoon et al., FVTD simulation for random rough dielectric surface scattering at low grazing angle, IEICE TR EL, E83C(12), 2000, pp. 1836-1843
Citations number
16
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEICE TRANSACTIONS ON ELECTRONICS
ISSN journal
09168524 → ACNP
Volume
E83C
Issue
12
Year of publication
2000
Pages
1836 - 1843
Database
ISI
SICI code
0916-8524(200012)E83C:12<1836:FSFRRD>2.0.ZU;2-B
Abstract
The Finite volume time domain (FVTD) method is applied to electromagnetic w ave scattering from random rough dielectric surfaces. In order to gain a be tter understanding of physics of backscattering of microwave from rough sur face, this paper treats both horizontal and vertical polarizations especial ly at low- grazing angle. The results are compared with those obtained by t he Integral equation method and the small perturbation method as well us wi th the experimental data. We have shown that the present method yields: a r easonable solution even at LGA. It should be noted that the number of sampl ing points pet wavelength for a rough surface problem should be increased w hen more accurate numerical results are required, which fact makes the comp uter simulation impossible at LGA fur a stable result. However, when the ex trapolation is used for calculating the scattered field, an accurate result can be estimated. If we want to obtain the ratio of backscattering between the: horizontal and vertical polarization, we do not need the large number of sampling points.