Near constant loss in glassy and crystalline LiAlSi2O6 from conductivity relaxation measurements

Polycrystalline and glassy LiAlSi2O6 are studied by dielectric relaxation m easurements for the purpose of characterizing the nearly frequency independ ent contribution to the dielectric loss (near constant loss), which is comm only found in glassy ionic conductors independent of the chemical and physi cal structures. The data show the near constant loss is present in both the polycrystalline and glassy states of LiAlSi2O6. Further, its magnitude and temperature dependence is comparable in both forms of the same substance. The implications of these findings on the mechanism that gives rise to the near constant loss are discussed. (C) 2001 American Institute of Physics.