The effect of Pb contamination on the solidification behavior of Sn-Bi solders

Citation
Kw. Moon et al., The effect of Pb contamination on the solidification behavior of Sn-Bi solders, J ELEC MAT, 30(1), 2001, pp. 45-52
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
30
Issue
1
Year of publication
2001
Pages
45 - 52
Database
ISI
SICI code
0361-5235(200101)30:1<45:TEOPCO>2.0.ZU;2-N
Abstract
This paper presents experimental results and theoretical calculations to ev aluate the effects of Pb contamination on the solidification behavior of Sn - x Bi alloys (x = 5, 10, and 58 mass %). The pasty (mushy) range, the typ e of solidification path, and the fraction of the ternary eutectic are desc ribed. The experimental results are obtained from thermal analysis and quan titative metallography, and the solidification calculations are performed u sing Lever and Scheil assumptions. The experimental, results agree with the Scheil calculations. The freezing range of Pb contaminated Sn-Bi solders i s greatly increased due to the formation of a ternary eutectic reaction at (95.3 +/- 0.5)degrees C. This increase is a likely cause of porosity in con taminated solder joints. The results provide an example of an analysis meth od for use in solder alloys in general.