Km. Wang et al., Refractive index profile and attenuation measurement in KTiOPO4 waveguide by megaelectronvolt He ions, J MATER RES, 16(1), 2001, pp. 276-279
An optically polished x-cut KTiOPO4 crystal of size 22 x 6 x 1.5 mm(3) was
implanted with 2.8-MeV He ions to a dose of 1.5 x 10(16) ions/cm(2) at room
temperature to form a waveguide. The prism coupling method was used to mea
sure the modes and the fiber probe technique was used to measure the attenu
ation in the KTiOPO4 waveguide. The refractive index profile, n(z), in the
KTiOPO4 waveguide was given based on the procedure by Chandler and Lama [P.
J, Chandler and F.L. Lama, Optica Acta 33, 123 (1986)]. The waveguide atten
uation measured was 2.57 dB/cm for m = 1 mode, After annealing at 260 degre
esC for 30 min, there was no obvious change in the KTiOPO4 waveguide attenu
ation.