The kinetics rate of the fluorine evolution reaction (FER) was studied in m
olten KF-2HF mainly by impedance spectroscopy with a rotating disk electrod
e in large potential and rotation speed ranges. A new model for the schemat
ic representation of the electrode/electrolyte interface has been proposed
including the presence of an intermediate layer between the electrode surfa
ce and the fluorine gas film. This layer is composed of a solid C-F compoun
d (generated on carbon anodes surface during the electrolysis), liquid KF-2
HF melt, and fluorine gas. The influence of the mass-transfer phenomenon oc
curring in that layer was pointed out in the low frequency part of the impe
dance diagrams. This intermediate layer gives also rise to a capacitive loo
p at very high frequency which does not vary with the applied potential and
the rotating speed values. The kinetics rate of the FER is governed both b
y the mass transfer and the charge transfer. Finally, the influence of the
C-F on the anodic overvoltage was studied. (C) 2000 The Electrochemical Soc
iety. S0013-4651 (00)04-082-9. All rights reserved.