Scanning tunneling microscopy of defects in quasiperiodically ordered surfaces

Citation
Ph. Ebert et al., Scanning tunneling microscopy of defects in quasiperiodically ordered surfaces, MAT SCI E A, 294, 2000, pp. 826-829
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
ISSN journal
09215093 → ACNP
Volume
294
Year of publication
2000
Pages
826 - 829
Database
ISI
SICI code
0921-5093(200012)294:<826:STMODI>2.0.ZU;2-O
Abstract
We demonstrate that the limited coherence length of a one-dimensional quasi periodically ordered superstructure of a thin Ag film on GaAs(110) surfaces is due to structural defects. We identify dislocations, phason defects, an d domain walls. The domain walls end at dislocations, whose stress field is found to induce a wide distribution of oriented phason defects. (C) 2000 E lsevier Science B.V. All rights reserved.