Grazing-incidence small-angle X-ray scattering on nanosized vanadium oxideand V/Ce oxide films

Authors
Turkovic, A Crnjak-Orel, Z Dubcek, P
Citation
A. Turkovic et al., Grazing-incidence small-angle X-ray scattering on nanosized vanadium oxideand V/Ce oxide films, MAT SCI E B, 79(1), 2001, pp. 11-15
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
ISSN journal
09215107 → ACNP
Volume
79
Issue
1
Year of publication
2001
Pages
11 - 15
Database
ISI
SICI code
0921-5107(20010104)79:1<11:GSXSON>2.0.ZU;2-P
Abstract
Vanadium oxide and new V/Ce oxide films on glass substrate were obtained by sol-gel dip-coating process. The average grain radius, [R], obtained by gr azing-incidence small-angle X-ray scattering for pure V2O5 was 7.49 +/- 1.0 6 nm. The average grain size [R] for mixed oxides depends on the atomic per cent of V in the sample. The fractal nature of some of these samples is ana lyzed. (C) 2001 Elsevier Science S.A. All rights reserved.