Development toward an all-silicon integrated thermal management system: the integrated MCM

Citation
J. Pilchowski et al., Development toward an all-silicon integrated thermal management system: the integrated MCM, MICROSYST T, 6(6), 2000, pp. 222-228
Citations number
14
Categorie Soggetti
Instrumentation & Measurement
Journal title
MICROSYSTEM TECHNOLOGIES
ISSN journal
09467076 → ACNP
Volume
6
Issue
6
Year of publication
2000
Pages
222 - 228
Database
ISI
SICI code
0946-7076(200011)6:6<222:DTAAIT>2.0.ZU;2-R
Abstract
A new all-silicon multichip module with integrated thermal management syste m is presented. Our new packaging approach combines the benefits of wafer-s cale integration with the flexibility of independently fabricated and pre-t ested devices, allowing the development of highly integrated systems. Wet a nisotropic etching is used for the dicing of silicon integrated circuits as well as for the fabrication of the chip-receiving cavities in the silicon substrate. The etching exposes {1 1 1} type planes in both chip and receivi ng surface, assuring a virtually perfect mating of the assemblage. The syst em is complemented with an integrated silicon heat sink, which can maintain heat fluxes in excess of 100 W/cm(2).