Electrical and optical properties of In2O3 thin films doped with boron and
nitrogen have been studied. Boron and nitrogen ions were implanted into In2
O3 thin films with an energy of 25 and 35 keV, respectively, at doses of 1
x 10(15)-1.6 x 10(16) cm(-2). After implantation the films were annealed fo
r 1 h in air and subsequently for 1 h in a vacuum. After the two-step annea
ling at 350 degreesC, the electrical resistivity of the boron implanted sam
ple with a dose of 4 x 10(15) cm(-2) achieved 4.4 x 10(-4) Omega cm with an
averaged optical transmittance of 84% at a wavelength between 380 and 780
nm. On the other hand, for nitrogen implanted samples, the resistivity did
not improve by ion implantation but the optical transmittance was unchanged
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