Porous silicon thermal conductivity by scanning probe microscopy

Citation
V. Lysenko et S. Volz, Porous silicon thermal conductivity by scanning probe microscopy, PHYS ST S-A, 182(2), 2000, pp. R6-R7
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
182
Issue
2
Year of publication
2000
Pages
R6 - R7
Database
ISI
SICI code
0031-8965(200012)182:2<R6:PSTCBS>2.0.ZU;2-I