Strain and band-edge alignment in single and multiple layers of self-assembled Ge/Si and GeSi/Si islands

Citation
Og. Schmidt et al., Strain and band-edge alignment in single and multiple layers of self-assembled Ge/Si and GeSi/Si islands, PHYS REV B, 62(24), 2000, pp. 16715-16720
Citations number
34
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
62
Issue
24
Year of publication
2000
Pages
16715 - 16720
Database
ISI
SICI code
0163-1829(200012)62:24<16715:SABAIS>2.0.ZU;2-H
Abstract
Strain in coherently embedded Ge/Si islands significantly modifies the band -edge alignment in and around the nanostructures. Our calculations on embed ded flat truncated Ge pyramids show that tensile strain in the surrounding Si causes a splitting of the sixfold-degenerate Delta valleys into the four fold-degenerate Delta (4) and twofold-degenerate Delta (2) valleys. This st rain-induced splitting energy can be larger than 400 meV in stacked Ge/Si i slands. The Delta (2) valleys in the Si constitute the conduction-band mini mum, and the heavy hole in the island constitutes the valence-band maximum. The band gap in the Si above and below the Ge island is smaller than for b ulk Si, in perfect agreement with recent experiments. Relevant energies are worked out as a function of Si interlayer thickness, number of islands, an d Ge concentration in the islands. We compare our calculations of the band- gap energy with photoluminescence experiments on embedded Ge islands, yield ing an average Ge fraction in the nanostructures of 60%.