Electron mobility measurement in n-GaAs at low-temperature impurity breakdown

Citation
V. Novak et al., Electron mobility measurement in n-GaAs at low-temperature impurity breakdown, PHYS REV B, 62(24), 2000, pp. 16768-16772
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
62
Issue
24
Year of publication
2000
Pages
16768 - 16772
Database
ISI
SICI code
0163-1829(200012)62:24<16768:EMMINA>2.0.ZU;2-S
Abstract
Using a combination of the standard Hall technique and the photoluminescenc e imaging of galvanomagentic transport, free-electron density and mobility have been measured in the regime of filamentary current flow after the elec tric breakdown of n-GaAs at the temperature of liquid helium. The data show good agreement with those acquired by the geometrical magnetoresistance ef fect and by the optical Hall angle measurement. By comparing the mobilities obtained by independent techniques, arguments have been found indicating s ignificant neutral impurity scattering in the post-breakdown regime. In the pre-breakdown regime variable range hopping has been concluded as the domi nant transport mechanism.