X-ray waveguides with multiple guiding layers

We have generalized the principle of resonant x-ray beam coupling to wavegu ides containing multiple guiding layers and characterized their x-ray optic al properties. In such a device, several coherent beams of a width on the o rder of 10-100 nm can be extracted at the end of the waveguide. By measurin g the farfield pattern formed by the interference of the beams, we demonstr ate the possibility of using these devices as new tools to tailor the field distribution in the near- and far-field region for specific applications: Besides coherent diffraction and imaging, interferometry with two or more n anometer sized beams can be envisioned.