N. De Angelis et al., Solar cell degradation by electron irradiation. Comparison between Si, GaAs and GaInP cells, SOL EN MAT, 66(1-4), 2001, pp. 495-500
We monitor the short circuit current and the open circuit voltage of Si, Ga
As and GaInP solar cells versus the fluence of 1 MeV electrons. From these
data, we extract the fluence dependences of the lifetime and of the concent
ration of compensating centers. This allows to compare in detail the radiat
ion hardness of cells made with these materials and to modelize their degra
dation under a given irradiation. (C) 2001 Elsevier Science B.V. All rights
reserved.