A detailed study of H-2 plasma passivation effects on GaAs/Si solar cell

Citation
G. Wang et al., A detailed study of H-2 plasma passivation effects on GaAs/Si solar cell, SOL EN MAT, 66(1-4), 2001, pp. 599-605
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
SOLAR ENERGY MATERIALS AND SOLAR CELLS
ISSN journal
09270248 → ACNP
Volume
66
Issue
1-4
Year of publication
2001
Pages
599 - 605
Database
ISI
SICI code
0927-0248(200102)66:1-4<599:ADSOHP>2.0.ZU;2-7
Abstract
The hydrogen plasma passivation effects of MOCVD-grown GaAs solar cell on S i substrate have been studied in detail. To get a more reproducible increas e of conversion efficiency and test the thermal stability of the plasma-exp osed GaAs/Si solar cell, both the plasma exposure and post-passivation anne aling conditions were optimized. Annealing the H-2 plasma passivated GaAs/S i solar cell at 450 degreesC in AsH3/H-2 ambient seems a very essential par ameter to restore the carrier concentration, especially, without losing the beneficial effects of H incorporation into GaAs on Si. For the H-2 plasma passivated GaAs/Si solar cell, a highest conversion efficiency of 18.3% was obtained compared with that of the as-grown cell (16.6%) due to the H pass ivation effects on nonradiative recombination centers, which increased the minority carrier lifetime. (C) 2001 Elsevier Science B,V. All rights reserv ed.