Scanning tunneling microscopy images of the atoms in the corner holes on the Si(111)-(7 x 7) surface with bismuth-covered tips

Authors
Bulavenko, SY Melnik, PV Nakhodkin, MG
Citation
Sy. Bulavenko et al., Scanning tunneling microscopy images of the atoms in the corner holes on the Si(111)-(7 x 7) surface with bismuth-covered tips, SURF SCI, 469(2-3), 2000, pp. 127-132
Citations number
12
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
469
Issue
2-3
Year of publication
2000
Pages
127 - 132
Database
ISI
SICI code
0039-6028(200012)469:2-3<127:STMIOT>2.0.ZU;2-R
Abstract
The use of special tips in scanning tunneling microscopy experiments for st udying the Si(111)-(7 x 7) surface is considered. The special tips are crea ted by bismuth deposition on tungsten tips. Images of the atoms in the corn er holes are obtained for the first time and the unartificial nature of the images has been checked by the adsorption of a low amount of atomic hydrog en on the Si(111)-(7 x 7) surface. (C) 2000 Elsevier Science B.V. All right s reserved.