The optical constants of thermally evaporated thin films of ZnS have been d
etermined by measurements of transmittance at normal incidence from two fil
ms of different thickness. A single-layer model has been successfully used
for the films. The results are compared with those obtained earlier for the
rmally evaporated ZnS films using reflectance and transmittance measurement
s (where a two-layer model for a ZnS film was used). The advantage of the p
resent method over the earlier one is the readily available measurement fac
ilities. (C) 2000 Elsevier Science B.V. All rights reserved.