Local structure of uncapped and Si-capped Ge quantum dots on Si(100) has be
en probed by extended x-ray absorption fine structure and x-ray absorption
near-edge structure spectroscopy. It is found that the uncapped Ge dots are
partially oxidized and partially alloyed with Si. The amount of Ge present
in the Ge phase is found to be about 20-30%. In the Si-capped sample, Ge i
s found to be dissolved in silicon, the fraction of Ge atoms existing as a
Ge phase being less than 10%. (C) 2001 American Institute of Physics.