HIGH-MOBILITY INVERTED MODULATION-DOPED GAAS ALGAAS HETEROSTRUCTURES/

Citation
T. Saku et al., HIGH-MOBILITY INVERTED MODULATION-DOPED GAAS ALGAAS HETEROSTRUCTURES/, JPN J A P 1, 33(9A), 1994, pp. 4837-4842
Citations number
19
Categorie Soggetti
Physics, Applied
Volume
33
Issue
9A
Year of publication
1994
Pages
4837 - 4842
Database
ISI
SICI code
Abstract
High-quality inverted GaAs/AlGaAs modulation-doped heterostructures ha ve been grown by MBE. An AlAs/GaAs superlattice buffer layer is grown below the AlGaAs spacer layer to improve the morphology at the inverte d heterointerface. An atomic layer doping and a thick spacer layer are adopted to alleviate the scattering by ionized donors. The observed e lectron mobility at 1.5 K is 4.3 x 10(6) cm(2)/Vs at a 2D electron den sity of 2.8x10(11)/cm(2). Two 2D electron channels; one formed at the inverted interface and the other at the normal interface are found to be operative in the observed characteristic. The electron mobility in the inverted channel is estimated to be as high as 4.9 x 10(6) cm(2)/V s at an electron density of 2.2 x 10(11)/cm(2), while, in the normal c hannel, it is 2.1 x 10(6) cm(2)/Vs at a density of 6 x 10(10)/cm(2).