The influence of the film-electrode interface on the ac-electric field depe
ndence of the dielectric permittivity in ferroelectric thin-film heterostru
ctures has been studied. The dielectric nonlinearities in epitaxial thin-fi
lm heterostructures of ferroelectric PbZr0.65Ti0.35O3 and relaxor ferroelec
tric (PbMg1/3Nb2/3O3)(0.68)-(PbTiO3)(0.32) were measured at subswitching fi
elds. A dramatic difference between the dielectric nonlinearities possessed
by ferroelectric films and those exhibited by the corresponding heterostru
ctures was revealed both by model evaluations and experimental observations
. In the heterostructures, due to the presence of an interface layer the di
electric nonlinearities can be considerably suppressed and their type can b
e changed compared to those in the films. (C) 2001 American Institute of Ph
ysics.