Dielectric nonlinearities in ferroelectric thin-film heterostructures

Citation
M. Tyunina et al., Dielectric nonlinearities in ferroelectric thin-film heterostructures, APPL PHYS L, 78(4), 2001, pp. 527-529
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
4
Year of publication
2001
Pages
527 - 529
Database
ISI
SICI code
0003-6951(20010122)78:4<527:DNIFTH>2.0.ZU;2-H
Abstract
The influence of the film-electrode interface on the ac-electric field depe ndence of the dielectric permittivity in ferroelectric thin-film heterostru ctures has been studied. The dielectric nonlinearities in epitaxial thin-fi lm heterostructures of ferroelectric PbZr0.65Ti0.35O3 and relaxor ferroelec tric (PbMg1/3Nb2/3O3)(0.68)-(PbTiO3)(0.32) were measured at subswitching fi elds. A dramatic difference between the dielectric nonlinearities possessed by ferroelectric films and those exhibited by the corresponding heterostru ctures was revealed both by model evaluations and experimental observations . In the heterostructures, due to the presence of an interface layer the di electric nonlinearities can be considerably suppressed and their type can b e changed compared to those in the films. (C) 2001 American Institute of Ph ysics.