Phase formation and texture development in Ag-sheathed Bi,Pb(2223) tapes studied by different in-situ and ex-situ diffraction techniques

In-situ and ex-situ high energy (80+88keV) X-Ray diffraction From a synchro tron radiation source were performed on multifilamentary Bi,Pb(2223)/Ag tap es using a transmission scattering geometry. Several thermo-mechanical proc edures were compared, focusing mainly on the texture development of both Bi ,Pb(2212) and Bi,Pb(2223) phases. The effect of the periodic pressing on th e texture and on the critical current is elucidated. The texture developmen t of the Bi,Pb(2212) phase prior to its transformation into Bi,Pb(2223) was directly observed in-situ at high temperature by using a dedicated high-en ergy X-ray compatible furnace and a high resolution Image Plate detector. A sharp increase of the Bi,Pb(2212) grain orientation along the [00l] direct ion was found to occur only above 750 degreesC. Normal state transport meas urements are in full agreement with the formation mechanism and with the te xture development observed. A comparison of the results with the ones provi ded by in-situ neutron diffraction and standard low-energy XRD in a reflect ion geometry is presented.