Development of buffer layer structures for YBa2Cu3O7-delta coated conductors on textured NI-V substrate

Citation
A. Mancini et al., Development of buffer layer structures for YBa2Cu3O7-delta coated conductors on textured NI-V substrate, INT J MOD B, 14(25-27), 2000, pp. 3128-3133
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
INTERNATIONAL JOURNAL OF MODERN PHYSICS B
ISSN journal
02179792 → ACNP
Volume
14
Issue
25-27
Year of publication
2000
Pages
3128 - 3133
Database
ISI
SICI code
0217-9792(20001030)14:25-27<3128:DOBLSF>2.0.ZU;2-L
Abstract
Y2O3 and MgO-based buffer layer architectures on non-magnetic cube textured Ni-V substrates were studied for YBa2Cu3O7-delta (YBCO) coated conductors fabrication using both pulsed laser deposition and electron beam evaporatio n The Y2O3 films exhibited a biaxial texture with phi and omega -scans full width at half maximum (FWHM) of about 11 degrees and 7 degrees and a smoot h and continuous surface. YBCO thick films deposited an CeO2/Y2O3/Ni-V and CeO2/Y2O3/NiO/Ni-V architectures were mainly c-axis oriented showing a T-C( R=0) above 85 K. MgO films were grown by electron beam evaporation both dir ectly on metallic substrates and with a Pd intermediate layer. The MgO film s grown on Ni-V substrates show a good texture and good surface morphologic al properties. The MgO deposition on Pd buffered Ni-V substrate leads to fi lms with better structural properties with respect to MgO depositon on bare Ni-V substrate, showing phi and omega -scans FWHM up to 8 degrees and 5 de grees, respectively. In spite of the interdiffusion between Pd buffer layer and Ni-V substrate, the MgO films preserve their structural and morphologi cal properties when annealed at typical YBCO deposition temperature.