FACTORS AFFECTING THE HEIGHT AND PHASE IMAGES IN TAPPING MODE ATOMIC-FORCE MICROSCOPY - STUDY OF PHASE-SEPARATED POLYMER BLENDS OF POLY(ETHENE-CO-STYRENE) AND POLY(2,6-DIMETHYL-1,4-PHENYLENE OXIDE)
G. Bar et al., FACTORS AFFECTING THE HEIGHT AND PHASE IMAGES IN TAPPING MODE ATOMIC-FORCE MICROSCOPY - STUDY OF PHASE-SEPARATED POLYMER BLENDS OF POLY(ETHENE-CO-STYRENE) AND POLY(2,6-DIMETHYL-1,4-PHENYLENE OXIDE), Langmuir, 13(14), 1997, pp. 3807-3812
Blends of two polymers, poly(ethene-co-styrene) (PES) and poly(2,6-dim
ethyl-1,4-phenylene oxide) (PPO), were examined with tapping mode atom
ic force microscopy (AFM) using various values of the driving amplitud
e A(0) and set-point amplitude ratio r(sp) = A(sp)/A(0), where A(sp) i
s the set-point amplitude. In height and phase images of PPO/PES blend
samples, the relative contrast of chemically different regions depend
s sensitively on the r(sp) and A(0) values. As the tip-sample force is
increased from small to large, both phase and height images of PPO/PE
S blend samples can undergo a contrast reversal twice. This makes it d
ifficult to assign the features of height and phase images to differen
t chemical components without performing additional experiments. Phase
and height images were interpreted by analyzing several factors that
affect the dependence of phase shift and amplitude damping on r(sp) an
d A(0).