Single-molecule analysis by noncontact atomic force microscopy

Authors
Sasahara, A Uetsuka, H Onishi, H
Citation
A. Sasahara et al., Single-molecule analysis by noncontact atomic force microscopy, J PHYS CH B, 105(1), 2001, pp. 1-4
Citations number
20
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF PHYSICAL CHEMISTRY B
ISSN journal
15206106 → ACNP
Volume
105
Issue
1
Year of publication
2001
Pages
1 - 4
Database
ISI
SICI code
1520-6106(20010111)105:1<1:SABNAF>2.0.ZU;2-T
Abstract
Atomic force microscopy operated in noncontact mode (NC-AFM) is a promising method for high-resolution sensing of a wide range of materials regardless of conductivity. Its feasibility in single-molecule analysis is demonstrat ed; formate (HCOO-) and acetate (CH3COO-) molecules were identified molecul e-by-molecule on a TiO2 substrate. The character of the tip-molecule force responsible for the observed image contrast is discussed.