Application of electron backscattered diffraction and crystal orientation mapping to recrystallisation studies in high strength interstitial free steels

Citation
Ij. Cross et al., Application of electron backscattered diffraction and crystal orientation mapping to recrystallisation studies in high strength interstitial free steels, MATER SCI T, 16(11-12), 2000, pp. 1380-1383
Citations number
7
Categorie Soggetti
Material Science & Engineering
Journal title
MATERIALS SCIENCE AND TECHNOLOGY
ISSN journal
02670836 → ACNP
Volume
16
Issue
11-12
Year of publication
2000
Pages
1380 - 1383
Database
ISI
SICI code
0267-0836(200011/12)16:11-12<1380:AOEBDA>2.0.ZU;2-
Abstract
Electron backscattered diffraction (EBSD) has been demonstrated to be a val uable tool in gathering data to aid in the understanding of microstructural development in a variety of materials. A high strength interstitial free s teel has been studied using the capabilities of a modern EBSD system, parti cularly by use of the crystal orientation mapping facility. Grain boundary characteristics have been determined and used to develop an understanding o f the recrystallisation process. Little evidence in favour of the oriented growth theory has been found. It is proposed that the nucleation process du ring annealing is critical in controlling the fully annealed texture. MST/4 794.