Application of electron backscattered diffraction and crystal orientation mapping to recrystallisation studies in high strength interstitial free steels
Ij. Cross et al., Application of electron backscattered diffraction and crystal orientation mapping to recrystallisation studies in high strength interstitial free steels, MATER SCI T, 16(11-12), 2000, pp. 1380-1383
Electron backscattered diffraction (EBSD) has been demonstrated to be a val
uable tool in gathering data to aid in the understanding of microstructural
development in a variety of materials. A high strength interstitial free s
teel has been studied using the capabilities of a modern EBSD system, parti
cularly by use of the crystal orientation mapping facility. Grain boundary
characteristics have been determined and used to develop an understanding o
f the recrystallisation process. Little evidence in favour of the oriented
growth theory has been found. It is proposed that the nucleation process du
ring annealing is critical in controlling the fully annealed texture. MST/4
794.