Ra. Schwarzer, Measurement of macrotexture by automated crystal orientation mapping: an alternative to X-ray diffraction, MATER SCI T, 16(11-12), 2000, pp. 1384-1388
Automated crystal orientation mapping (ACOM) with digital beam scan in the
SEM enables crystal orientation mapping and quantitative texture analysis o
n large specimen areas of half a square centimetre wide or more, without sa
crificing accuracy of orientation measurement or spatial resolution, provid
ed that program facilities for dynamic focusing of the beam, dynamic system
calibration, and automatic flat fielding for background correction are ava
ilable. At present, the speed of ACOM exceeds 25 000 orientations per hour
with cubic and hexagonal crystal symmetry. The orientation density function
has been calculated using the data from ACOM measurement by series expansi
on under the assumption of triclinic sample symmetry and various spreads of
the Gaussian function. ACOM competes well in speed and in results,vith X-r
ay diffraction, but is a more universal instrument owing to the additional
facilities of SEM. Grain statistics are similar with both techniques since
they depend on the ratio of average grain size to measured area. The advant
ages and limitations of macrotexture determination by ACOM are discussed. M
ST/4795.