A wavelet analysis of 1/f and white noise in microwave transistors

The results of a computer-controlled experiment devoted to on-line measurem ents of the wavelet transform (WT) of low-frequency electronic noise voltag e in bipolar microwave transistors are presented. We measure the average re currence time of fluctuations of the WT coefficients occurring selectively in limited time and at frequency intervals. We detect two quite different b ehaviors in such recurrence times in the 1/f and white noise regimes. (C) 2 001 Elsevier Science Ltd. All rights reserved.