Two scanning electron microscopy (SEM) electron-specimen interactions that
provide images based on sample crystal structure, electron channelling and
electron backscattered diffraction, are described. The SEM operating condit
ions and sample preparation are presented, followed by an example applicati
on of these techniques to the study of pyritised plant material. The two ap
proaches provide an opportunity to examine simultaneously, at higher magnif
ications normally available optically, detailed specimen anatomy and preser
vation state. Our investigation suggests that whereas both techniques have
their advantages, the electron channelling approach is generally more readi
ly available to most SEM users. However, electron backscattered diffraction
does afford the opportunity of automated examination and characterisation
of pyritised fossil material. (C) 2000 Elsevier Science B.V. All rights res
erved.