Pre-sputtering and plasma-assisted nitriding of pure aluminium and 2024 alu
minium alloy were studied in situ by plasma monitoring and ex situ by sever
al surface analysis methods. The influence of the process parameters, time,
temperature, pressure and gas composition on mass and energy distributions
of ions, as well as on topography and chemical composition, was examined.
The chronology of the sputtering process could thus be clarified. An oxide
film which is relatively thick compared to the native oxide layer and enric
hed with magnesium is formed at the initial stage of the sputtering treatme
nt, followed by the removal of this film with a subsequent roughening of th
e surface. The cleaning effect of the plasma can be enhanced by increasing
the argon pressure or by an intermixture of hydrogen. Due to a supplementar
y chemical etching, hydrogen admixture reduces the surface roughness and ef
fectively decreases the oxygen content of the surface. During the nitriding
treatment, nanocrystalline hexagonal aluminium nitride AIN is formed. Grow
th rate and nitrogen content of the nitride layer were found to strongly de
pend on the gas composition during sputtering and nitriding. The positive e
ffect of addition of argon and hydrogen, respectively, arises from an inten
sification of the nitrogen plasma, the production of nitrogen-hydrogen mole
cular ions and an increase of the ion energy. The nitrogen pressure affects
the layer thickness due to higher nitrogen activity and ion energies. The
chemical composition of the cathode material influences discharge current a
nd, as a result, the ion energies. (C) 2001 Elsevier Science B.V. All right
s reserved.