Nucleation of Ge quantum dots on the C-alloyed Si(001) surface

Citation
O. Leifeld et al., Nucleation of Ge quantum dots on the C-alloyed Si(001) surface, THIN SOL FI, 380(1-2), 2000, pp. 176-179
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
380
Issue
1-2
Year of publication
2000
Pages
176 - 179
Database
ISI
SICI code
0040-6090(200012)380:1-2<176:NOGQDO>2.0.ZU;2-X
Abstract
Carbon pre-deposition onto the bare Si(001) surface has been shown to alter the (2 x 1) surface structure by formation of c(4 x 4) reconstructed domai ns containing a high C-concentration. Here we studied by ultra-high vacuum scanning tunneling microscopy the effect of this restructured surface on th e initial stages of Ge nucleation by molecular beam epitaxy. Ge is found to form three-dimensional (3D) islands already at sub-munolayer coverage, res ulting in a Volmer-Weber growth mode. Strain effects repel Ge adatoms from the C-rich domains, leading to enhanced Ge island formation on the C-free s urface regions in between the c(4 x 4) areas. At a low growth temperature o f 350 degreesC, very small three-dimensional islands (3-5 nm in diameter, b right 3-4 ML) with a density of nearly 1 x 10(12) cm - are obtained for onl y 0.5 ML of Ce. At higher substrate temperatures of approximately 500 degre esC this three-dimensional growth mode is less pronounced, but still eviden t. The initially nucleated three-dimensional islands define the positions o f the larger quantum dots at higher Gr coverage, that exhibit enhanced phot oluminescence (PL) properties. (C) 2000 Elsevier Science B.V. All rights re served.