Citation
A. Klein et al., Electronic properties of WS2 monolayer films, THIN SOL FI, 380(1-2), 2000, pp. 221-223
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090
→ ACNP
Volume
380
Issue
1-2
Year of publication
2000
Pages
221 - 223
Database
ISI
SICI code
0040-6090(200012)380:1-2<221:EPOWMF>2.0.ZU;2-D
Abstract
Monolayer films of layered metal dichalcogenides WS, were grown on single c
rystalline graphite substrates by metal-organic van der Waals-epitaxy. An a
ngle-resolved valence band structure of the quasi free-standing films has b
een determined by photoelectron spectroscopy. (C) 2000 Elsevier Science B.V
. All rights reserved.