Probe microanalysis investigation and electroreflectance spectroscopy of Hg1-xCdxTePLD films on silicon patterned substrates

Authors
Gorbach, TY Matveeva, LA Smertenko, PS Svechnikov, SV Venger, EF Kuzma, M Wisz, G Ciach, R Rakowska, A
Citation
Ty. Gorbach et al., Probe microanalysis investigation and electroreflectance spectroscopy of Hg1-xCdxTePLD films on silicon patterned substrates, THIN SOL FI, 380(1-2), 2000, pp. 256-258
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
380
Issue
1-2
Year of publication
2000
Pages
256 - 258
Database
ISI
SICI code
0040-6090(200012)380:1-2<256:PMIAES>2.0.ZU;2-1
Abstract
Hg1-xCdxTe films were prepared on Si-patterned substrates by the pulse lase r deposition technique from a Hg1-xCdxTe target (x approximate to 0.2). The effects of different substrate temperatures, ranging from 293 to 543 K, di fferent laser shots number in the range of 10-380, and the morphological ty pe of the patterned substrate on the x-composition of films were studied by electron probe microanalysis (EPMA) and electroreflectance (ER) spectrosco py. The correlation between a film composition measured by EPMA and one det ermined from ER spectra data was observed. (C) 2000 Published by Elsevier S cience B.V. All rights reserved.