Tr. Welberry et al., Diffuse X-ray scattering from benzil, C14H10O2: analysis via automatic refinement of a Monte Carlo model, ACT CRYST A, 57, 2001, pp. 101-109
A recently developed method for fitting a Monte Carlo computer-simulation m
odel to observed single-crystal diffuse X-ray scattering has been used to s
tudy the diffuse scattering in benzil, diphenylethanedione, C6H5-CO-CO-C6H5
. A model involving 13 parameters consisting of 11 intermolecular force con
stants, a single intramolecular torsional force constant and a local Debye-
Waller factor was refined to give an agreement factor, R = [Sigma omega(Del
taI)(2) / Sigma omegaI(obs)(2)](1/2), of 14.5% for 101 324 data points. The
model was purely thermal in nature. The analysis has shown that the diffus
e lines, which feature so prominently in the observed diffraction patterns,
are due to strong longitudinal displacement correlations. These are transm
itted from molecule to molecule via a network of contacts involving hydroge
n bonding of an O atom on one molecule and the para H atom of the phenyl ri
ng of a neighbouring molecule. The analysis also allowed the determination
of a torsional force constant for rotations about the single bonds in the m
olecule. This is the first diffuse scattering study in which measurement of
such internal molecular torsion forces has been attempted.