We report on a novel phenomenon in oxygen-deficient Ge-doped silica glasses
at room temperature. Irradiation of focused 120 fs laser pulses at 800 nm
induced long-lasting phosphorescence with peaks at 290 and 390 nm for oxyge
n-deficient Ge-doped silica glass. The phosphorescence persisted for not le
ss than 1 h after the removal of the irradiating light. The intensity of th
e phosphorescence at 390 nm increased with an increase in the concentration
of oxygen-deficiency associated with Ge ions. Based on the time dependence
of the intensity of the phosphorescence, the longlasting phosphorescence i
n these glasses is considered to be due to the thermally activated electron
-hole recombination at shallow traps. (C) 2001 Elsevier Science B.V. All ri
ghts reserved.